Transcription of Basic RF Testing of CCxxxx Devices - Texas Instruments
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Basic RF Testing of CCxxxx Devices - Texas Instruments
ApplicationReportSWRA370 'low-powerRFproductswithanoverviewofthed ifferentcharacterizationtests(conducted, notradiated) ,thetermCCxxxxreferstothelow-powerCC25xx ,CC11xx,CC10XX, : RFTesting RXTest ConformanceTesting OutputPower SmartRFStudio TXTest CharacterizationTest SensitivitySmartRFis a , a a , a a August2011 BasicRFTestingofCCxxxxDevicesSubmitDocum entationFeedbackCopyright 2011, August2011 SubmitDocumentationFeedbackCopyright 2011, (Example).. (withoutLabVIEW) August2011 BasicRFTestingofCCxxxxDevicesSubmitDocum entationFeedbackCopyright 2011, 'low-powerRFproductswithanoverviewofthed ifferentcharacterizationtests(conducted, notradiated) betterunderstandingofthesystemsandfuncti ons, low-powerRFproductsmakeit easiertobuildwirelesslinksforremotecontr ol,metering, ,theyareusedinsideunlicensed.
Introduction www.ti.com 1 Introduction This document provides the user of Texas Instruments' low-powerRF products with an overview of the different characterization tests (conducted, not radiated) that are performed during the device verification
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