Transcription of Data sheet acquired from Harris Semiconductor
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Data sheet acquired from Harris Semiconductor
data sheet acquired from Harris SemiconductorSCHS072B Revised July 2003 Lamp Test (LT), Blanking (BL), and LatchEnable or Strobe inputs are provided to testthe display, shut off or intensity-modulate it,and store or strobe a BCD code, different signals may be multiplexedand displayed when external multiplexingcircuitry is CD4511B types are supplied in 16-leadhermetic dual-in-line ceramic packages(F3A suffix), 16-lead dual-in-line plasticpackages (E suffix), 16-lead small-outlinepackages (NSR suffix), and 16-lead thinshrink small-outline packages (PW and PWRsuffixes).These devices are similar to the 2003, Texas Instruments IncorporatedPACKAGE OPTION 1 PACKAGING INFORMATIONO rderable DeviceStatus(1)Package TypePackageDrawingPinsPackageQtyEco Plan(2)Lead/Ball Finish(6)MSL Peak Temp(3)Op Temp ( C)Device Marking(4/5)SamplesCD4511 BEACTIVEPDIPN1625Pb-Free(RoHS)CU NIPDAUN / A for Pkg Type-55 to 125CD4511 BECD4511 BEE4 ACTIVEPDIPN1625Pb-Free(RoHS)CU NIPDAUN / A for Pkg Type-55 to 125CD4511 BECD4511 BFACTIVECDIPJ161 TBDA42N / A for Pkg Type-55 to 125CD4511 BFCD4511BF3 AACTIVECDIPJ161 TBDA42N / A for Pkg Type-55 to 125CD4511BF3 ACD4511 BNSRACTIVESONS1
PACKAGE OPTION ADDENDUM www.ti.com 10-Jun-2014 Addendum-Page 2 (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a …
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