Transcription of Data sheet acquired from Harris Semiconductor
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Data sheet acquired from Harris Semiconductor
data sheet acquired from Harris SemiconductorSCHS072B Revised July 2003 Lamp Test (LT), Blanking (BL), and LatchEnable or Strobe inputs are provided to testthe display, shut off or intensity-modulate it,and store or strobe a BCD code, different signals may be multiplexedand displayed when external multiplexingcircuitry is CD4511B types are supplied in 16-leadhermetic dual-in-line ceramic packages(F3A suffix), 16-lead dual-in-line plasticpackages (E suffix), 16-lead small-outlinepackages (NSR suffix), and 16-lead thinshrink small-outline packages (PW and PWRsuffixes).
PACKAGE OPTION ADDENDUM www.ti.com 24-Aug-2018 Addendum-Page 2 (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device.
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