Deposition - INRF
Thin dielectric films are deposited using plasma enhanced chemical vapor deposition (PECVD) or remote plasma chemical vapor deposition (RPCVD) of SiO2, Si3N4 or a-Si. The source gases for the PECVD SiO2 films are 5% SiH4 in N2 plus N2O; for SixNy films source gases include 5% SiH4 in N2 plus NH3 and N2.
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