Transcription of 橡 ED-4701 1 开䔀开⸀倀䐀 - JEITA
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橡 ED-4701 1 开䔀开⸀倀䐀 - JEITA
Standard of Japan Electronics and Information Technology Industries AssociationEIAJ ED-4701 /100 Environmental and endurance test methods forsemiconductor devices(Life test I)Established in August, 2001 Prepared byTechnical Standardization Committee on Semiconductor DevicesPublished byJapan Electronics and Information Technology Industries Association11, Kanda Surugadai 3-chome, Chiyoda-ku, Tokyo 101-0062, JapanPrinted in JapanTranslation without guarantee in the event of any doubt arising, the original standard in Japanese isto be standards are established independently to any existing patents on the products, materials orprocesses they assumes absolutely no responsibility toward parties applying these standards or toward patent owners. 2001 by the Japan Electronics and Information Technology Industries AssociationAll rights reserved. No part of this standards may be reproduced in any form or by any meanswithout prior permission in writing from the ED-4701 /100 CONTENTSPage1.
Standard of Japan Electronics and Information Technology Industries Association EIAJ ED-4701/100 Environmental and endurance test methods for semiconductor devices
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