Transcription of FAILURE MECHANISM BASED STRESS TEST QUALIFICATION …
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AEC - Q100 - Rev-G. May 14, 2007. FAILURE MECHANISM BASED . STRESS TEST QUALIFICATION . FOR. integrated CIRCUITS. Automotive Electronics Council Component Technical Committee AEC - Q100 - REV-G. May 14, 2007. Automotive Electronics Council Component Technical Committee TABLE OF CONTENTS. AEC-Q100 FAILURE MECHANISM BASED STRESS Test QUALIFICATION for integrated Circuits Appendix 1: Definition of a QUALIFICATION Family Appendix 2: Q100 Certification of Design, Construction and QUALIFICATION Appendix 3: Plastic Package Opening for Wire Bond Testing Appendix 4: Minimum Requirements for QUALIFICATION Plans and Results Appendix 5: part Design Criteria to Determine Need for EMC Testing Appendix 6: part Design Criteria to Determine Need for SER Testing Attachments AEC-Q100-001: WIRE BOND SHEAR TEST.
1.2.1 Automotive AEC-Q001 Guidelines for Part Average Testing AEC-Q002 Guidelines for Statistical Yield Analysis AEC-Q003 Guidelines for Characterizing the Electrical Performance AEC-Q004 Zero Defects Guideline (DRAFT) SAE J1752/3 Integrated Circuits Radiated Emissions Measurement Procedure 1.2.2 Military
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