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Handbook of ICP-QQQ applications - Agilent
Removal of MH + interferences in refined REE material analysis La, Ce, Pr 103 Direct analysis of trace REEs in high purity Nd 2 O 3 Dy, Tb, Ho 106 Direct determination of challenging trace rare earth elements in high purity lanthanide REE oxides REEs 109 Analysis of 10 nm gold nanoparticles using the high sensitivity of the Agilent 8900 ICP-QQQ ...
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