Introduction to Scanning Electron Microscopy

Introduction to Scanning Electron Microscopy By: Brandon Cheney Ant s Leg Integrated Circuit Nano-composite This document was created as part of a Senior Project in the Materials Engineering Department at San Jose State University. It is intended to provide an Introduction Scanning Electron Microscopy and techniques for better imaging. References are provided at the end of the paper for those who wish to study the subject more thoroughly. 1. Introduction The SEM instrument is made up of two main components, the electronic console and the Electron column. The electronic console provides control knobs and switches that allow for instrument adjustments such as filament current, accelerating voltage, focus, magnification, brightness and contrast.

Feb 01, 2005 · In scanning electron microscopy visual inspection of the surface of a material utilizes signals of two types, secondary and backscattered electrons. Secondary and backscattered electrons are constantly being produced from the surface of the specimen while under the electron beam however they are a result of two separate types of interaction.

Loading..

Tags:

  Introduction, Electron, Scanning, Microscopy, Scanning electron microscopy, Introduction to scanning electron microscopy

Information