Transcription of IPC-TM-650 High Speed/High Frequency Test …
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IPC-TM-650 High Speed/High Frequency Test …
SummaryThis method is for measurement of relativepermittivity ( r) and dissipation factor or loss tangent (tan )ofcircuit board substrates under stripline conditions. Measure-ments are made by measuring resonances of a length of strip-line over a wide Frequency range from below 1 GHz to about14 GHz(1,2). The method permits a wide variety of specimenconfigurations, varying in dielectric thickness, width of centerconductor, and use of clad or laid up conductor foil(3). Sensi-tivity to differences in tan are enhanced by the ability toadjust the degree of coupling to the resonator by adjusting anair gap between probes and the resonator ends. Many of theprinciples used in IPC-TM-650 , Method , are applied inthis TerminologyTerms used in this method include:Complex Relative Permittivity The values for relative permit-tivity and dissipation factor considered as a complex Dielectric constant (see IPC-T-50) or relative per-mittivity.
1.0 Scope 1.1 Summary This method is for measurement of relative permittivity (ε r) and dissipation factor or loss tangent (tan δ)of circuit board …
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