Transcription of IPC-TM-650 High Speed/High Frequency Test …
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SummaryThis method is intended for the rapid mea-surement of the X-band ( to GHz) apparent relativestripline permittivity (see ) and loss tangent of metal cladsubstrates. Measurements are made under stripline condi-tions using a resonant element pattern card, which is sepa-rated from the ground planes by sheets of the material to betested. Further information about this method may be found inASTM DefinitionsTerms used in this method include:Complex Relative PermittivityThe values for relative per-mittivity and dissipation factor considered as a complex constant (see IPC-T-50) or relative per-mittivity. The symbol used in this document is or aresometimes PermittivityA dimensionless ratio of absolute per-mittivity of a dielectric to the absolute permittivity of a TangentDissipation factor (see IPC-T-50), dielectricloss tangent.
from the base boards to the top of the 25.4 mm x 51 mm area to which clamping pressure is applied. The minimum horizon-tal dimension must be enough to extend at least 6.5 mm
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