Transcription of IPFA 2018 TECHNICAL PROGRAM 16 - 19 July
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IPFA 2018 TECHNICAL PROGRAM 16 - 19 July
IPFA 2018 TECHNICAL PROGRAM 16 - 19 July Time 16 July (Day 0) - Tutorials and Workshops Session TUT A: Tutorials Session TUT B: Tutorials 08:30 hrs Tutorial Session Chair: Alfred Quah, GLOBALFOUNDRIES Singapore Tutorial Session Chair: Venkat Krishnan Ravikumar, AMD Singapore BEOL Reliability - From FinFETs to More-than-Moore Internet of Things and Low Power Technology Devices Concepts and Fault Isolation on Chip and System Level 08:30 - 10:30 hrs TUT A1 TUT B1. (Dr. Jeff Gambino, ON Semiconductor , USA) (Prof. Christian Boit, TU Berlin, Germany). 10:30 -10:45 hrs Tea Break FinFET and Post-FinFET Advanced Logic Device SiP, Packaged Stacked Devices and other Challenging Reliability A Review 3D Assembly Analysis 10:45 - 12:45 hrs TUT A2 TUT B2. (Prof. Aaron Thean, NUS, Singapore) (Dr. Philippe Perdu, CNES, France).
Time 08:30 hrs 08:30 - 10:30 hrs TUT A1 BEOL Reliability - From FinFETs to More-than-Moore Devices (Dr. Jeff Gambino, ON Semiconductor , USA) TUT B1
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