Transcription of Measurement Techniques - Vishay
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Measurement Techniques - Vishay
Measurement Techniques Vishay Semiconductors Measurement Techniques INTRODUCTION VS = 80 V. The characteristics of optoelectronics devices given in ( > VR max.). datasheets are verified either by 100 % production tests followed by statistic evaluation or by sample tests on typical I = 10 A. 100 A. specimens. These tests can be divided into following constant categories: Dark measurements VR. Light measurements V. Measurements of switching characteristics, cut-off frequency and capacitance Ri > 10 M . Angular distribution measurements 94 8206. Spectral distribution measurements Fig. 2. Thermal measurements Dark and light measurements limits are 100 % For most devices, VR is specified at 10 A reverse current. measurements. All other values are typical. The basic In this case either a high impedance voltmeter has to be circuits used for these measurements are shown in the used, or current consumption of DVM has to be calculated following sections. The circuits may be modified slightly to and added to the specified current.
Measurement Techniques www.vishay.com Vishay Semiconductors Rev. 1.4, 31-Jul-12 1 Document Number: 80085 For technical questions, contact: emittertechsupport@vishay.com
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