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Measurement Techniques - Vishay
Measurement Techniques Vishay Semiconductors Measurement Techniques INTRODUCTION VS = 80 V. The characteristics of optoelectronics devices given in ( > VR max.). datasheets are verified either by 100 % production tests followed by statistic evaluation or by sample tests on typical I = 10 A. 100 A. specimens. These tests can be divided into following constant categories: Dark measurements VR. Light measurements V. Measurements of switching characteristics, cut-off frequency and capacitance Ri > 10 M . Angular distribution measurements 94 8206. Spectral distribution measurements Fig. 2. Thermal measurements Dark and light measurements limits are 100 % For most devices, VR is specified at 10 A reverse current.
Measurement Techniques www.vishay.com Vishay Semiconductors Rev. 1.4, 31-Jul-12 3 Document Number: 80085 For technical questions, contact: emittertechsupport@vishay.com
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