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Memory Testing and Built -In Self -Test
EE1411 VLSI Test Principles and ArchitecturesCh. 8 - Memory Testing & BIST - P. 1 Chapter Chapter 88 Memory Testing and BuiltMemory Testing and Built --In SelfIn Self--TestTestEE1412 VLSI Test Principles and ArchitecturesCh. 8 - Memory Testing & BIST - P. 2 What is this chapter about?What is this chapter about? Basic concepts of Memory Testing andBIST Memory fault models and test algorithms Memory fault simulation and test algorithm generation RAMSES: fault simulator TAGS: test algorithm generator Memory BIST BRAINS: BIST generatorEE1413 VLSI Test Principles and ArchitecturesCh. 8 - Memory Testing & BIST - P. 3 Typical RAM Production FlowTypical RAM Production FlowWaferWaferFull Probe TestMarkingFinal TestShippingQA Sample TestVisual InspectionBurn-In (BI)Post-BI TestLaser RepairPackagingPre-BI TestEE1414 VLSI Test Principles and ArchitecturesCh.
EE141 3 VLSI Test Principles and Architectures Ch. 8-Memory Testing &BIST -P. 3 Typical RAM Production Flow Wafer Full Probe Test Marking Final Test Visual Inspection QA …
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