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MIL-STD-883E, Test Method Standard for Microcircuits

0,/ 67' ( '(&(0%(5 '(&(0%(5 683(56(',1* 683(56(',1*0,/ 67' '0,/ 67' ' 129(0%(5 129(0%(5 '(3$570(17 2) '()(16('(3$570(17 2) '()(16(7(67 0(7+2' 67$1'$5'7(67 0(7+2' 67$1'$5'0,&52&,5&8,760,&52&,5&8,76$06& 1 $ )6& ',675,%87,21 67$7(0(17 $',675,%87,21 67$7(0(17 $ $SSURYHG IRU SXEOLF UHOHDVH GLVWULEXWLRQ LV XQOLPLWHG $SSURYHG IRU SXEOLF UHOHDVH GLVWULEXWLRQ LV XQOLPLWHG 7KH GRFXPHQWDWLRQ DQG SURFHVVFRQYHUVLRQ PHDVXUHV QHFHVVDU\ WRFRPSO\ ZLWK WKLV UHYLVLRQ VKDOO EHFRPSOHWHG E\ 0D\ ,1&+ 3281',1&+ 3281'MIL-STD-883 EiiFOREWORD1. This military Standard is approved for use by all Departments and Agencies of the Department of Defense.*2. Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving thisdocument should be addressed to: Defense Supply Center Columbus, Box 3990, Columbus, OH 43216-5000, by usingthe self-addressed Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document orby Intended use of or reference to Government Non-Government Order of , SYMBOLS, AND Abbreviations, symbols, and Numbering))))))))))))))))))))))))))))

TEST METHODS METHOD NO. TEST PROCEDURES 5001 Parameter mean value control 5002.1Parameter distribution control 5003 Failure analysis procedures for microcircuits 5004.10 Screening procedures 5005.13 Qualification and quality conformance procedures 5006 Limit testing 5007.6Wafer lot acceptance 5008.8Test procedures for hybrid and multichip ...

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