Transcription of MTTF,Failrate,Reliability,and Life Testing
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MTTF,Failrate,Reliability,and Life Testing
At Burr-Brown, we characterize and qualify the reliability ofour devices through high temperature life Testing . The re-sults of this Testing are quantified with such values as MTTFand failure rate. This information can be very valuable whenused for comparative purposes or applied to reliability cal-culations. However, this information loses its worth if it isnot precisely understood and appropriately employed. It isthe intent of this application note to bring together, in aconcise format, the definitions, ideas, and justificationsbehind these reliability concepts in order to provide thebackground details necessary for full and correct utilizationof our life Testing PRELIMINARY DEFINITIONSR eliability is the probability that a part will last at least aspecified time under specified experimental conditions (1).
2 Let reliability be represented by R(t) and failure rate by Z(t). Then and Remember, reliability is the probability that a part will function at least a specified time.
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