Transcription of Reliability of Staked Surface Mount Packages - ieee-astr.org
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Reliability of Staked Surface Mount Packages - ieee-astr.org
Accelerated Stress Testing and Reliability Conference Reliability of Staked Surface Mount Packages Deng Y. Chen and Dr. Michael Osterman Center for Advanced life cycle Engineering (CALCE) University of Maryland, College Park, MD 20742 Email: ASTR 2016, Sep 28-30, Pensacola, FL January-4-17 1 Accelerated Stress Testing and Reliability Conference CALCE Facilities and Capabilities September 28- 30 2016, Pensacola Beach, Florida 2 Non-Destructive Evaluation 3D X-ray Imaging System Scanning Acoustic Microscope (SAM) Fourier Transform Infrared Spectroscopy (FTIR) Automated Contact Resistance Probe (ACRP) X-Ray Fluorescence Spectroscopy (XRF) Electronic Testing and Analysis Semiconductor Parameter Analyzer Impedance Analyzer ( ) Microcircuit Probe High Power Curve Tracer LCR meter Dynamic Signal Analyzer Event Detectors Electrometer LCZ Meter Thermal Inducing System (-80oC to 225oC)
Accelerated Stress Testing and Reliability Conference Reliability of Staked Surface Mount Packages Deng Y. Chen and Dr. Michael Osterman Center for Advanced Life Cycle Engineering (CALCE)
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