Transcription of Simultaneous atomic-resolution electron …
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Simultaneous atomic-resolution electron …
ARTICLER eceived 22 Dec 2015|Accepted 8 Jul 2016|Published 26 Aug 2016 Simultaneous atomic - resolution electronptychography andZ-contrast imaging of lightand heavy elements in complex nanostructuresH. Yang1, Rutte2, L. Jones1, M. Simson3, R. Sagawa4, H. Ryll5, M. Huth3, Pennycook6, Green2,H. Soltau3, Y. Kondo4, Davis2& Nellist1 The aberration-corrected scanning transmission electron microscope (STEM) has emergedas a key tool for atomic resolution characterization of materials, allowing the use of imagingmodes such asZ-contrast and spectroscopic mapping. The STEM has not been regarded asoptimal for the phase-contrast imaging necessary for efficient imaging of light , recent developments in fast electron detectors and data processing capability is shownto enable electron ptychography, to extend the capability of the STEM by allowingquantitative phase images to be formed simultaneously with incoherent signals. Wedemonstrate this capability as a practical tool for imaging complex structures containing lightand heavy elements, and use it to solve the structure of a beam-sensitive carbon nanos-tructure.
A first proof-of-principle attempt to form simultaneous ADF and phase-contrast images21 was also limited in field of view by the camera speed. Differential phase …
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