Transcription of Vi-Chip Environmental Qualification Testing …
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Page 1 of 14 VI chip Environmental Qualification Testing Standards Revision:0 Report Dated: June 11th, 2014 Report Prepared By: Noel Joyce Reliability Lab Manager Page 2 of 14 Table of Contents .. 3 Summary .. 3 Test Conditions.. 4 HIGH TEMPERATURE OPERATING BIAS TEST (HTOB) .. 4 Test Criteria .. 4 TEMPERATURE CYCLING (TC) TEST .. 5 Cycling (TC) Test Criteria .. 5 TEMPERATURE HUMIDITY BIAS (THB) .. 6 THB Conditions .. 6 LOW TEMPERATURE STORAGE TEST ( LTS) .. 7 HIGH TEMPERATURE STORAGE TEST ( HTS).
Page 3 of 14 1. Purpose This report outlines environmental testing which were performed to qualify the Vicor VI Chip platform. 2. Executive Summary
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PRINTED WIRING BOARD RELIABILITY, Thermal shock, Comparison Testing of Shock vs, Comparison testing of shock, General Specification Electrical Function General, Highly Accelerated, Services, Testing Services, Testing, OneTechnologyWay P.O.Box9106 Norwood, Reliability, ELECTRONICS INDUSTRIES Performance Test, AIM™ in a VIA Package