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Chapter 4. Basic Failure Modes and Mechanisms

Chapter 4. Basic Failure Modes and Mechanisms

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Hydrogen-related degradation may cause the same observed pinch-off voltage degradation effects [1]. This degradation is theorized to be caused by either a reduction of carrier concentration in the active channel of the device or a change in the surface state built-in potential. Further information on this degradation is found in Section II.D.2.

  Basics, Dome, Chapter, Failure, Chapter 4, Mechanisms, Degradation, Basic failure modes and mechanisms

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