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Chapter 4. Basic Failure Modes and Mechanisms - NASA

Chapter 4. Basic Failure Modes and Mechanisms - NASA

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A detailed discussion of failure mechanisms will be presented in Section II. B. Degradation in Gate Leakage Current This failure mode is generally observed in devices subjected to an accelerated life test or to high operating temperatures. The degradation is observed as an increase in the gate leakage current over the duration of the test.

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