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Device Reliability Report First Half 2021

Device Reliability Report First Half 2021

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technology. In ESD and Latch-up Summary, updated specifications and removed list of devices. Removed notes 2 and 3 from Table 8. Added Table 17. Removed Table 9: ESD and Latch-up Data for XC2VPxxx. Added VU57P, ZU58DR, and ZU59DR to Table 16. In Table 18, added 7 nm process technology, updated device hours and FIT for 16 nm, 20 nm,

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