MEMS Solution for Semiconductor Probing - SWTest.org
MEMS Solution for Semiconductor Probing South-Western Testing Workshop Presentation 矽晶源高科股份有限公司 SCS Hightech Inc. Presented by Dr. Howard Hsu
Download MEMS Solution for Semiconductor Probing - SWTest.org
Information
Domain:
Source:
Link to this page:
Documents from same domain
Introduction to Wafer Level Burn-In - SWTest.org
www.swtest.orgIntroduction to Wafer Level Burn-In William R. Mann General Chairman Southwest Test Workshop
(AUTOMATIC VISUAL INSPECTION) for Probe …
www.swtest.orgPRESENTS Using AVI (AUTOMATIC VISUAL INSPECTION) for Probe Mark Inspection and Implementing AVI into the Test Floor Production Process Mamo Matsushime Texas Instruments, Hiji
Introduction to Probe Cards - SWTest.org
www.swtest.orgMichael George (408) 727-6500 x6244 ©Copyright 1998 Wafer Alignment (2) Automatic Alignment. Title: T1_Hank.PDF Created Date: Saturday, September 12, 1998 3:50:14 AM
Impact of Bond Pad Corrosion - SWTest.org
www.swtest.orgJune 6 to 9, 2010 IEEE SW Test Workshop 2 Overview • Clean the wafer –not the probe card • History of contamination • Corrosion removal • Examples of Pre and Post Cleans
Motorola Wafer Level Burn-in and Test - SWTest.org
www.swtest.orgTutorial on “Motorola Wafer Level Burn In and Test” 2002 Southwest Test Workshop; Long Beach, CA Teresa McKenzie; June 9, 2002 Page 2 Agenda / Outline
INTRODUCTION TO PHYSICS OF CONTACT …
www.swtest.orgSouthWest Test Workshop - San Diego, 1998 January Kister TECHNOLOGY Page 10 PROBE INTRODUCTION TO PHYSICS OF CONTACT RESISTANCE Film Thickness Vs. Tunnel Resistivity
Southwest Test Conference - SWTest.org
www.swtest.orgSpeakers q Hank Scutoski – VP Quality – 30 Years Experience – TI, Motorola, Cerprobe – Motorola University’s Six Sigma Research Institute – Certified Quality Engineer
Standardizing WSP Wafer Socket Pogo Pin Probe Cards
www.swtest.orgJune 6 to 9, 2010 IEEE SW Test Workshop 3 Introduction • Recent growth of WLCSP‐Wafer Level Chip Size Package probing created an opportunity for probe card hardware standardization
An Analysis of Contact Resistance between Probe Tip and ...
www.swtest.orgAn Analysis of Contact Resistance between Probe Tip and Gold Pad Chang‐Hoon. Hyun Samsung Semiconductor Institute of Technology Company Logo