Search results with tag "Mems solution for semiconductor probing"

MEMS Solution for Semiconductor Probing - SWTest.org

4 Introduction Device Geometry vs. IC Characteristics KGD Wafer Level Burn In I/O pins over 1000 High speed test Burn-in and test before packagein and test before package

  Introduction, Solutions, Levels, Semiconductors, Mems, Burn, Wafer, Probing, Mems solution for semiconductor probing, Wafer level burn