Search results with tag "Negative bino mial"

Yield and Yield Management - Smithsonian Institution

Seeds’ model, as well as the newer negative binomial model, can be used to estimate yield from defect density and die size. In comparison (Figure 3-8), each model has a different way of accounting for the distribu-tion of defects on a wafer. The negative bino-mial model accounts for particle clustering on wafers. Unfortunately, this model is also

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