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Code Coverage Analysis of Combinatorial Testing
ceur-ws.orgCode Coverage Analysis of Combinatorial Testing Eun-Hye Choi⇤, Osamu Mizuno†, Yifan Hu† ⇤ National Institute of Advanced Industrial Science and Technology (AIST), Ikeda, Japan Email: e.choi@aist.go.jp † Kyoto Institute of Technology, Kyoto, Japan Email: o-mizuno@kit.ac.jp, y-hu@se.is.kit.ac.jp Abstract—Combinatorial t-way testing with small t is known as