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IEC 61000-4-x Tests for TI s Protection Devices

IEC 61000-4-x Tests for TI s Protection Devices

www.ti.com

15 ms 300 ms Voltage 5 x 50 ns Voltage www.ti.com IEC 61000-4-4 EFT Immunity 2.3 IEC 61000-4-4 Type Burst Suppression Through TVS Diodes The amount of energy of EFT events is around several hundreds of milli-Joules.

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