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Search results with tag "Stuck at fault"
Fault Modeling - Electrical Engineering and Computer Science
web.eecs.umich.eduFor digital logic single stuck-at fault model offers best advantage of tools and experience. Many other faults (bridging, stuck-open and multiple stuck-at) are largely covered by stuck-at fault tests. Stuck-short and delay faults and technology-dependent faults …
stuck at fault - Stanford University
web.stanford.edu13 Defect Detection in a NAND Gate zFor a 2-input NAND gate, the complete stuck-at test set is: AB = 01, 10 and 11 zWith a defect in the NAND cell, the gate may produce any combinations of 0, 1, N, Z N is an indeterminate logic value (active, driven) Z is a floating node with unknown charge (passive) zEach of 4 possible input vectors can produce any