High Speed Optocoupler, Single and Dual, 10 MBd

1 6N137, VO2601, VO2611, VO2630, VO2631, Semiconductors Rev. , 27-Sep-161 Document Number: 84732 For technical questions, contact: DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENTARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT Speed optocoupler , Single and Dual, 10 MBdDESCRIPTIONThe 6N137, VO2601, and VO2611 are Single channel 10 MBd optocouplers utilizing a high efficient input LED coupled with an integrated optical photodiode IC detector. The detector has an open drain NMOS-transistor output, providing less leakage compared to an open collector Schottky clamped transistor output. The VO2630, VO2631, and VO4661 are dual channel 10 MBd optocouplers. For the Single channel type, an enable function on pin 7 allows the detector to be strobed.

2 The internal shield provides a guaranteed common mode transient immunity of 5 kV/ s for the VO2601 and VO2631 and 15 kV/ s for the VO2611 and VO4661. The use of a F bypass capacitor connected between pin 5 and 8 is Choice of CMR performance of 15 kV/ s, 5 kV/ s, and 1000 V/ s High Speed : 10 MBd typical +5 V CMOS compatibility Pure tin leads Guaranteed AC and DC performance over temperature Meets IEC 60068-2-42 (SO2) and IEC 60068-2-43 (H2S) requirements Low input current capability of 5 mA Material categorization: for definitions of compliance please see Microprocessor system interface PLC, ATE input / output isolation Computer peripheral interface Digital fieldbus isolation: CC-link, DeviceNet, profibus, SDS High Speed A/D and D/A conversion AC plasma display panel level shifting Multiplexed data transmission Digital control power supply Ground loop elimination, noise isolationAGENCY APPROVALS UL1577 cUL DIN EN 60747-5-5 (VDE 0884-5) available with option 1 BS EN 60950-1 CQC GB8898-2011, channel12348765 NCACNCVCCVEVOGNDS ingle channel6N137, VO2601, VO2611VO2630, VO2631, VO4661 ORDERING INFORMATIONVO2601-X0##TPART NUMBERPACKAGE OPTIONTAPEANDREELAGENCY CERTIFIED/PACKAGECHANNELS 1 CHANNELS 2 CMR (V/ s)CMR (V/ s)BSI, UL, cUL1000500015 0001000500015 000 DIP-86N137VO2601VO2611VO2630VO2631VO4661 DIP-8, 400 mil (option 6)6N137-X006VO2601-X006VO2611-X006VO2630 -X006VO2631-X006VO4661-X006 SMD-8 (option 7)

3 6N137-X007 TVO2601-X007T VO2611-X007T VO2630-X007T VO2631-X007T VO4661-X007 TSMD-8 (option 9)6N137-X009T--VO2630-X009T--VDE, BSI, UL, cUL1000500015 0001000500015 000 DIP-8, 400 mil (option 6)-VO2601-X016VO2611-X016-VO2631-X016-SM D-8 (option 7)-VO2601-X017T VO2611-X017T-VO2631-X017T-> mm> mmDIP-8 Option 7 Option 6 Option 96N137, VO2601, VO2611, VO2630, VO2631, Semiconductors Rev. , 27-Sep-162 Document Number: 84732 For technical questions, contact: DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENTARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. Functional operation of the device is not implied at these or any other conditions in excess of those given in the operational sections of this document.

4 Exposure to absolute maximum ratings for extended periods of the time can adversely affect TABLE (positive logic)LEDENABLEOUTPUTOnHLOffHHOnLHOffLHO nNCLOffNCHABSOLUTE MAXIMUM RATINGS (Tamb = 25 C, unless otherwise specified)PARAMETERCONDITIONSSYMBOLVALUE UNITINPUTA verage forward current ( Single channel)IF20mAAverage forward current (per channel for dual channel)IF15mAReverse input voltageVR5 VEnable input voltageVEVCC + VVEnable input currentIE5mASurge currentt = 100 sIFSM200mAOutput power dissipation ( Single channel)Pdiss35mWOutput power dissipation (per channel for dual channel)Pdiss25mWOUTPUTS upply voltage1 min maximumVCC7 VOutput currentIO50mAOutput voltageVO7 VOutput power dissipation ( Single channel)Pdiss85mWOutput power dissipation (per channel for dual channel)Pdiss60mWCOUPLERS torage temperatureTstg-55 to +150 COperating temperatureTamb-40 to +100 CLead solder temperaturefor 10 s260 CSolder reflow temperature260 C6N137, VO2601, VO2611, VO2630, VO2631, Semiconductors Rev.

5 , 27-Sep-163 Document Number: 84732 For technical questions, contact: DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENTARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT 1 - Total Power Dissipation vs. Ambient Temperature( Single channel)Fig. 2 - Total Power Dissipation vs. Ambient Temperature(dual channel)Fig. 3 - Forward Current vs. Ambient Temperature( Single channel)Fig. 4 - Forward Current vs. Ambient Temperature(dual channel) 020406080100 0255075100125 Ptot - Total Power Dissipation (mW)Tamb - Ambient Temperature ( C) OutputInput020406080100 0255075100125 Ptot - Total Power Dissipation (mW)Tamb - Ambient Temperature ( C) OutputInput0255075100125 IF - Forward Current (mA) Tamb - Ambient Temperature ( C)0510152025300255075100125 IF - Forward Current (mA) Tamb - Ambient Temperature ( C)051015202530 RECOMMENDED OPERATING CONDITIONSPARAMETERTEST temperatureTamb-40100 CSupply current low levelIFL0250 AInput current high levelIFH515mALogic high enable voltageVEH2 VCCVL ogic low enable pull up resistorRL3304K FanoutRL = 1 k N-5-6N137, VO2601, VO2611, VO2630, VO2631, Semiconductors Rev.

6 , 27-Sep-164 Document Number: 84732 For technical questions, contact: DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENTARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT Minimum and maximum values are testing requirements. Typical values are characteristics of the device and are the result of engineering evaluation. Typical values are for information only and are not part of the testing Over recommended temperature (Tamb = -40 C to +100 C), VCC = 5 V, IF = mA unless otherwise specified. All typicals at Tamb = 25 C, VCC = 5 V.(1)75 ns applies to the 6N137 only, a JEDEC registered specificationELECTRICAL CHARACTERISTICS (Tamb = 25 C, unless otherwise specified)PARAMETERTEST forward voltageIF = 10 currentVR = 5 AInput capacitancef = 1 MHz, VF = 0 VCI-55-pFOUTPUTHigh level supply current ( Single channel)VE = V, IF = 0 = VCC, IF = 0 level supply current (dual channel)IF = 0 level supply current ( Single channel)VE = V, IF = 10 mAICCL-47mAVE = VCC, IF = 10 level supply current (dual channel)IF = 10 level output currentVE = 2 V, VCC = V, IF = 250 ALow level output voltageVE = 2 V, IF = 5 mA,IOL (sinking) = 13 threshold currentVE = 2 V, VCC = V,IOL (sinking)

7 = 13 level enable currentVE = 2 level enable currentVE = level enable voltageVEH2- -VLow level enable CHARACTERISTICSPARAMETERTEST delay time to high output levelRL = 350 , CL = 15 pFtPLH204875 (1)nstPLH--100nsPropagation delay time to low output levelRL = 350 , CL = 15 pFtPHL255075 (1)nstPHL--100nsPulse width disortionRL = 350 , CL = 15 pF|tPHL - tPLH| delay skewRL = 350 , CL = 15 pFtPSK-840nsOutput rise time (10 % to 90 %)RL = 350 , CL = 15 pFtr-23- nsOutput fall time (90 % to 10 %)RL = 350 , CL = 15 pFtf-7-nsPropagation delay time of enable from VEH to VELRL = 350 , CL = 15 pF,VEL = 0 V, VEH = 3 VtELH-12- nsPropagation delay time of enable from VEL to VEHRL = 350 , CL = 15 pF,VEL = 0 V, VEH = 3 VtEHL-11- ns6N137, VO2601, VO2611, VO2630, VO2631, Semiconductors Rev. , 27-Sep-165 Document Number: 84732 For technical questions, contact: DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE.

8 THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENTARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT 5 - Single Channel Test Circuit for tPLH, tPHL, tr and tfFig. 6 - Dual Channel Test Circuit for tPLH, tPHL, tr and tfFig. 7 - Single Channel Test Circuit for tEHL, and tELH1 2 3 4 8 7 6 5 18964-2 The probe and Jig capacitances are included in C Input I FOutput V OI F0 mAV VtPHLtPLHV OHC = 15 pFGND FbypassVCCVOUTV CCI FRR LInpu tI FmonitoringnodeOutput V OmonitoringnodeLSingle channelPulse = 50 t= t = 5 nsofrML= mAI F= mAVE12348765 GNDVCCP ulse = 50 tf = tr = 5 nsInputmonitoringnodeDual channelOutput VmonitoringnodeOIFRMRLCL= Fbypass18963-5 VCC1 2 3 4 8 7 6 5 18975-2 The probe and Jig capacitances are included in C Inpu tV EOutput V Ot EHLt ELHC = 15 pFGND FbypassVCCVOUTV CCI FR L Output V OmonitoringnodeLSingle channelPulse = 50 t= t = 5 mAInput V monitoring nodeE3 VVE6N137, VO2601, VO2611, VO2630, VO2631, Semiconductors Rev.

9 , 27-Sep-166 Document Number: 84732 For technical questions, contact: DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENTARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT (1)For 6N137 and VO2630(2)For VO2601 and VO2631(3)For VO2611 and VO4661 Fig. 8 - Single Channel Test Circuit for Common Mode Transient ImmunityFig. 9 - Dual Channel Test Circuit for Common Mode Transient ImmunityCOMMON MODE TRANSIENT IMMUNITY (Tamb = 25 C, unless otherwise specified)PARAMETERTEST mode transient immunity|VCM| = 10 V, VCC = 5 V, IF = 0 mA,VO(min.) = 2 V, RL = 350 , Tamb = 25 C (1)|CMH|1000V/ s|VCM| = 50 V, VCC = 5 V, IF = 0 mA,VO(min.) = 2 V, RL = 350 , Tamb = 25 C (2)|CMH|500010 000V/ s|VCM| = 1 kV, VCC = 5 V, IF = 0 mA,VO(min.) = 2 V, RL = 350 , Tamb = 25 C (3)|CMH|15 00025 000V/ s|VCM| = 10 V, VCC = 5 V, IF = mA,VO(max.)

10 = V, RL = 350 , Tamb = 25 C (1)|CML|1000V/ s|VCM| = 50 V, VCC = 5 V, IF = mA,VO(max.) = V, RL = 350 , Tamb = 25 C (2)|CML|500010 000V/ s|VCM| = 1 kV, VCC = 5 V, IF = mA,VO(max.) = V, RL = 350 , Tamb = 25 C (3)|CML|15 00025 000V/ sVCM(peak)Switch AT A: IFSwitch AT A:VO( (max.)0 V5 FbypassVCCVOUTVCCRLO utput VOmonitoringnode+-VCMS ingle channelBAVFFIFP ulse generatorZ = 50 OVE)= 0 mAIF= mA1 2 3 4 8 7 6 5 18977-1 GND FbypassVCCR LOutput V Omonitoringnode+ - V CMB A V FFI FPulse generatorZ = 50 ODual channelVCC6N137, VO2601, VO2611, VO2630, VO2631, Semiconductors Rev. , 27-Sep-167 Document Number: 84732 For technical questions, contact: DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENTARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT As per IEC 60747-5-5, , this optocoupler is suitable for safe electrical insulation only within the safety ratings.