Introduction to Surface Mount Device Measurement

1 Introduction C&L TestingProduct Note: B6140121 Introduction to Surface Mount Device MeasurementIntroductionTo measure SMD ( Surface Mount devices ) components accurately, it is necessary to remove any outside influences which might change or mask the true characteristics of the Device . For characterization, the DUTs are placed on a microstrip circuit and TRL de-embedding is used to shift the reference planes to precise locations. This eliminates the influences of the cables and test fixture environment. The SMD can be a capacitor, inductor, resistor, filter, etc. ICM test fixtures are designed to allow the DUTs to be tested over a wide frequency range and appropriate TRL standards are included in the Measurement Solution Kits.

2 Many DUT sizes can be tested in any desired configuration. For custom requirements, please contact the SMD Device is placed onto a microstripCalibration Standards are inserted into the Mainframe for calibrationReference planes after calibration (red arrows)The Midsection is inserted into the Mainframe for Device measurementsComponents of the Measurement Solution KitThe Measurement Solution Kit provides all the items needed to measure SMD devices . Each kit contains a number of Midsections for specific DUT sizes. Additional sizes can be tested by selecting the appropriate Midsections.

3 A TRL Calibration Kit is included to de-embed the Test Fixture. The Mainframe makes it very convenient to measure many different devices quickly. Capacitor is placed onto microstrip lineMidsection Adapter with pusherUniversal MainframeTRL Calibration KitPage 1 Introduction C&L TestingMeasurement Configurations AvailableMeasurement Configurations AvailableThe SMD components can be measured in three different configurations. In the Series-Thru configuration, the Device is inserted between two 50 ohm lines in series. In the Shunt-Thru configuration, the Device is placed between a 50 ohm line and ground.

4 In the Shunt-to-Ground configuration, the DUT is positioned at the end of a 50 ohm line and ConfigurationThe DUT is in Series with a 50 ohm lineShunt-Thru ConfigurationThe DUT is placed between a 50 ohm line and GroundShunt-to-Ground ConfigurationThe DUT is placed at the end of a 50 ohm line to GroundPage 2 Introduction C&L TestingComplete Measurement SolutionCapacitor in Series-Thru configurationComplete Measurement Solution Kit SERIES-THRU Configuration Measurement Solution KitsICM P/NSubstrateFrequencyMainframeTRL Cal KitDUT sizes*A313979715 mil AluminaDC - 10 GHz10 GHz Mainframe included15 mil Calibration

5 Kit includedMidsections included for 01005, 0201, 0402A313998215 mil AluminaDC - GHz Mainframe included15 mil Calibration Kit includedMidsections included for 01005, 0201, 0402A313998325 mil AluminaDC - 10 GHz10 GHz Mainframe included25 mil Calibration Kit includedMidsections included for 0201, 0402, 0603A313998425 mil AluminaDC - GHz Mainframe included25 mil Calibration Kit includedMidsections included for 0201, 0402, 0603* Additional DUT sizes can be added by selecting the appropriate midsectionPage 3 Introduction C&L TestingSeries-THRU MidsectionsCapacitor in Series-Thru configurationMidsection Assembly for SERIES-THRU MeasurementsSERIES-THRU for Measurement of Capacitors in series with a 50 Ohm THRU lineMidsection Assy.

6 P/NConfigurationGap Width G (mils)Chip Capacitor StyleTrace WidthCalibration KitA0139798 Series Thru80100515 milA0139796 or A0139988A0139799 Series Thru12020115 milA0139796 or A0139988A0139900 Series Thru25040215 milA0139796 or A0139988A0139961 Series Thru12020125 milA01397989 or A0139990A0139962 Series Thru25040225 milA01397989 or A0139990A0139963 Series Thru25060325 milA01397989 or A0139990A0139964 Series Thru30080525 milA01397989 or A0139990A0139965 Series Thru75120625 milA01397989 or A0139990 Reference: Hewlett-Packard Product Note 8510-17, Measuring Chip Capacitors with the HP 8510C Network Analyzers and Inter-Continental Microwave Test Fixtures and Agilent Product Note , (available in our Application Notes section)Page 4 Introduction C&L TestingShunt-THRU MidsectionsCapacitor or Inductor in SHUNT-THRU ConfigurationMidsection Assembly for SHUNT-THRU MeasurementsSHUNT-THRU for Measurement of Capacitors in series with a 50 Ohm THRU lineMidsection Assy.

7 P/NConfigurationGap Width G (mils)Chip Capacitor StyleTrace WidthCalibration KitA0139966 Shunt Thru80100515 milA0139796 or A0139988A0139967 Shunt Thru12020115 milA0139796 or A0139988A0139968 Shunt Thru25040215 milA0139796 or A0139988A0139969 Shunt Thru12020125 milA01397989 or A0139990A0139970 Shunt Thru25040225 milA01397989 or A0139990A0139971 Shunt Thru25060325 milA01397989 or A0139990A0139972 Shunt Thru30080525 milA01397989 or A0139990A0139973 Shunt Thru75120625 milA01397989 or A0139990 Reference: Hewlett-Packard Product Note 8510-17, Measuring Chip Capacitors with the HP 8510C Network Analyzers and Inter-Continental Microwave Test Fixtures and Agilent Product Note , (available in our Application Notes section)Page 5 Introduction C&L TestingShunt-to-Ground MidsectionsCapacitor or Inductor in SHUNT-to-GROUND ConfigurationMidsection Assembly for SHUNT-to-GROUND MeasurementsSHUNT-to-GROUND for Measurement of Capacitors from a 50 Ohm line to groundMidsection Assy.

8 P/NConfigurationGap Width G (mils)Chip Capacitor StyleTrace WidthCalibration KitA0139974 Shunt-to-Ground80100515 milA0139796 or A0139988A0139975 Shunt-to-Ground12020115 milA0139796 or A0139988A0139976 Shunt-to-Ground25040215 milA0139796 or A0139988A0139977 Shunt-to-Ground12020125 milA01397989 or A0139990A0139978 Shunt-to-Ground25040225 milA01397989 or A0139990A0139979 Shunt-to-Ground25060325 milA01397989 or A0139990A0139980 Shunt-to-Ground30080525 milA01397989 or A0139990A0139981 Shunt-to-Ground75120625 milA01397989 or A0139990 Reference: Hewlett-Packard Product Note 8510-17, Measuring Chip Capacitors with the HP 8510C Network Analyzers and Inter-Continental Microwave Test Fixtures and Agilent Product Note , (available in our Application Notes section)

9 Page 6 Introduction C&L TestingAccessories for the Universal Mainframe Universal Mainframes AvailableUniversal Test Fixture MainframeUniversal Mainframe shown with Midsection inserted ICM P/NSubstrateFrequencyNumber of RFsTRL Cal KitDUT sizes*A0138569for 15 mil or 25 milDC - 10 GHz2any Cal Kit listedany midsection listedA0139985for 15 mil or 25 milDC - GHz2any Cal Kit listedany midsection listed* The above Mainframes are compatible with any Midsection and any TRL Calibration Kit listed 7 Introduction C&L TestingAccessories for TRL Calibration KitsTRL Calibration Kits AvailableTRL Calibration StandardsUniversal Mainframe shown with THRU Standard insertedICM P/N*SubstrateFrequencyCalibration TypeNumber of standards includedCompatible MidsectionsA013979615 milDC - 10 GHzTRL5any midsection with 15 mil substrateA013998815 milDC - GHzTRL5any midsection with 15 mil substrateA013998925 milDC - 10 GHzTRL5any midsection with 25 mil substrateA013999025 milDC - GHzTRL5any midsection with 25 mil substrate* All Calibration Standards are compatible with any Universal Mainframe abovePage 8 Introduction C&L TestingApplication

10 NotesAvailable Application NotesApplication NoteICM Part NumberAgilent Part NumberImpedance Characteristic Evaluation of SMD by Using the ENA with Inter-Continental Microwave (ICM) Test Fixture Application Note: 1463-5 or 5989-0547 ENNotes on Capacitor and Inductor Testing in Series-Thru, Shunt-Thru and Shunt-to-ground ConfigurationsB6137223 User Manual for Test Fixture A0134552AB6140033 Page 9