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光による 半導体評価 (半 ... - ishikawa-nct.ac.jp

測定例1 ZnTe薄膜のPLと反射スペクトル I n t e n s i t y (a.u.) 520 525 530 535 Wavelength (nm) I 1 C I 1 C-LO I 1 As I 2 Ga R6LO X hh X lh ZnTe/GaAs

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