LEVEL? - Defense Technical Information Center

1 NPRD-2 LEVEL? NONELECTRONIC PARTSRELIABILITY DATADTICELECTEDC10 191~ll| DSUMMER 1981 reliability Analysis CenterROME AIR DEVELOPMENT CENTER81 12 10 001"THE reliability ANAL YSIS Center IS A DOD Information ANALYSIS CENTERTHE Information AND data CONTAINED HEREIN HAVE BEEN COMPILED FROM GOVERNMENTAND NONGOVERNMENT Technical REPORTS AND FROM MATERIAL SUPPLIED BY VARIOUSMANUFACTURERS AND ARE INTENDED TO BE USED FOR REFERENCE PURPOSES. NEITHER THEUNITED STATES GOVERNMENT NOR lIT RESEARCH INSTITUTE WARRANT THE ACCURACY OFTHIS Information AND data .

2 THE USER IS FURTHER CAUTIONED THAT THE data CONTAINEDHEREIN MA Y NOT BE USED IN LIEU OF OTHER CONTRACTUALLY CITED REFERENCES ANDSPECIFICA OF THIS Information IS NOT AN EXPRESSION OF THE OPINION OF THE UNITEDSTATES GOVERNMENT OR OF lIT RESEARCH INSTITUTE AS TO THE QUALITY OR DURABILITYOF ANY PRODUCT MENTIONED HEREIN AND ANY USE FOR ADVERTISING OR PROMOTIONALPURPOSES OF THIS Information IN CONJUNCTION WITH THE NAME OF THE UNITED STATESGOVERNMENT OR lIT RESEARCH INSTITUTE WITHOUT WRITTEN PERMISSION IS reliability Analysis CenterA DoD Information Analysis CenterNONELECTRONIC PARTSRELIABILITY DATAP repared by:Robert G.

3 ArnolIT Research InstituteUnder Contract to:Rome Air Development CenterGriffiss AFB, NY 13441 Ordering No. NPRD-2 DTICSELECTEDA pproved for Public Releae, Distribution Unlimited S EC 10 1981D~ (Iiiil1~The reliability hAmYSIS CENER is a DoD Information analysisCenter, operated by IIT Research Institute under contract to the Rome Air Devel-opment Center , reliability Analysis Center (RAC) is a Department of Defense Infor-mation Analysis Center sponsored by the Defense Logistics Agency, managed by theRome Air Development Center (RADC), and operated at RADC by IIT ResearchInstitute (IITRI).)

4 RAC is charged with the collection, analysis and dissemin-ation of reliability Information pertaining to parts used in electronic present scope includes integrated circuits, hybrids, discrete transistorsand diodes, microwave devices, optoelectronics, and selected nonelectronic partsemployed in military, space and commercial addition, a System/Equipment reliability Corporate Memory (RCM) is alsooperating under the auspices of the RAC and serves as the focal point for thecollection and analysis of all reliability -related Information and data onoperating and planned military systems and are collected on a continuous basis from a broad range of sourcesincluding testing laboratories, device and equipment manufacturers, governmentlaboratories, and equipment users, both government and nongovernment.

5 Automaticdistribution lists, voluntary data submittal, and field failure reportingsystems supplement an intensive data solicitation data documents covering most of the device types mentionedabove are available annually from RAC. Also, RAC provides reliability consultingand Technical and bibliographic inquiry services which are fully discussed at theend of this FOR Technical ASSISTANCE ALL OTHER REQUESTS SHOULD BEAND Information ON AVAILABLE RAC DIRECTED TO:SERVICES AND PUBLICATIONS KAY BEDIRECTED TO:Charles E.

6 Ehrenfried Rome Air Development CenterReliability Analysis Center RBE/Charles F. BoughRome Air Development Center (RBRAC) Griffiss Air Force Base, NY 1311 Griffiss Air Force Base, NY 13441 Telephone: 315/330-4920 Telephone: 315/330-4151 Autovon: 587-4920 Autovon: 587-4151(D 1981, IIT Research o All Rights ReservedSECURITY CLASSIFICATION OF THIS PAGE (When Dot. )_PAGE READ INSTRUCTIONSREPORT DOCUMENTATION BEFORE COMPLETING FORMI. REPORT NUMBER 2. G VT ACCESSION NO. 3 RECIPIENT'S CATALOG NUMBERNPRD-2 / cj4. TITLE (inWd Subtitle) S.)

7 TYPE OF REPORT & PCRIOD COVEREDN onelectronic Parts reliability data -2 N/AS. PERFORMING O1G. REPORT NUMBER7. AUTHO:i(.) S. CONTRACT OR GRANT NUMBER(.)Robert G. Arno F30602-78-C-02819. PERFORMING ORGAk' ATIDN NAME AND ADDRESS I0. PROGRAM ELEMENT. PROJECT. TASKR eliability Analysis Center (RBRAC) AREA A WORK UNIT NUMBERSRome Air Development CenterGriffiss Air Force Base, New York 13441I1. CONTROLLING OeFICE NAME AND ADDRESS 12. REPORT DATtRome Air fevelopment Center Summer 1981 Griffiss Air Force Base, New York 13441 13.

8 NUMBEROFPAGES14. MONITORING AGESICY NAME & AODRESS(,/ ,,nt from Cont-11ina Office) IS SECURITY CLASS. 'of this report)Unclassi fiedIS. OECLASSIFICATION DOWNGRADINGSCHEDULEIS. DISTRIBUTION STATEMENT (of this Report)Approved for public release; distribution from RAC or DISTRIBUTION STATEMENT (of the obstrcit entered in Block 20, II different from Report)IS. SUPPLEMENTARY NOTESThis is the second in a series of publications dealing with the nonelectronicparts reliability and supersedes NPRD-1, dated "KEY WORDS (Continue on reverie side if nece**&,, end identify by block number)Nonelectronic Parts Failure Modes and Mechanismsfailure Rates Electromechanical ComponentReliability Information Mechanical Parts20.

9 ABSTRACT (Corttlans on reverse side It neceoary end Identify by block number)-_ -This report, organized in four major sections, presents reliabilityinformation based on field operation, dormant state and test data for morethan 250 major nonelectronic part types. The four sections are Generic data ,Detailed data , Application data , and Failure Modes and Mechanisms. Eachdevice type contains reliability Information in relation to the specificoperational environments.,.,DD 1473 EDITION Of I NOV 65 I OOSOLETESECURITY CLASSIFICATION Of THIS PAGE (When Veto Ent-led)UiUNCLASSIFIEDsgCUPirY CLA*SI CATION OF THIS PAO6(WUa DNAt * )UNCLASSIFIEDISCURITY CLAGSIPICATION OF ' PAoGrVWhe data is the second edition of a series of data publications dealing withnonelectronic reliability at the part level.

10 NPRD-Z updates NPRD-1 by expandingthe scope and quality of data presented in these reliability publications are intended tocompliment such documents as MIL-HDBK-217 and MIL-STD-883. The user iscautioned, however, that the data contained herein may not be used in lieu ofcontractually cited references. It should also be noted that the data contained inthis document is failure data , not part replacement data . Only verified failureswere used in the calculations of the failure ForNTIS GRnt'DTIC TAB 0~DTICW ffmouned 0]JustificationD _DEC 10 1981 fAvailability CoGeI 0 AvailanG/orlat specialDVTABLE OF CONTENTSINTRODUCTION 1 SECTION 1: NONELECTRONIC GENERIC FAILURE RATES 3 Definitions of Terms 5 Index for Generic Failure Rates 10 Generic Failure Rate Tables 21 SECTION Z: NONELECTRONIC PARTS DETAILED data 117 Nonelectronic Parts Detailed data 119 Index for Detailed data lzDetailed data Tables 125 SECTION 3.