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変電機器の短絡試験技術 - meidensha.co.jp

Hitoshi Saito Yoshihiko Matsui Akihiko Nakayama Tetsushi Takahashi ISO/IEC17025 .. 1963 .. 1000 MVA 14kV 50Hz . 5 MVA .. 1 .. 2014 5 . ISO/IEC 17025 . JAB .. 4 . ISO/IEC . 17025 .. 60Hz .. 1 . 2 ISO/IEC 17025 . kA . kA .. JSTC Japan 18 357 2017 1 .. EO/OE k 2 EO/OE k 2 A/D O/E . E/O . a .. 1 .. IEC 62271 100 5 .. 3 . A/D O/E . E/O .. b .. 1 .. 5000 10,000 .. Short Circuit Testing Committee .. kV 84kV .. 357 2017 19. C2. MCCB MC MB2 LG T3 MB1. DS ACB. R1 MB2 T4. Rf IVR1 T1 T2 IVR2. R2 R3. T0 MS2. C3 C1. CT1. VT VD1. Sh1 L. MCCB MC VD2 LA1 LA2 LA3 CT2 MB1.. 2 . DS .. I 257A rms . RV rms I 1340A peak f 206Hz V peak t 339ms . a b . 3 . 206Hz 1340A 257A 84kV . 30 MVA . 2 . PLC Programmable 60Hz 50Hz . Logic Controller JEC 2300 2010 .. 60Hz .. 3 4 a . n .. 4 60Hz .. 20 357 2017 3 .. 50Hz 50Hz t 1ms 2 n.

明電時報 通巻357号 2017 No.4 19 Short Circuit Testing Committee)が管理する標 準分流器⑴との比較試験によって校正と不確かさの 算定を行った。 一方,数kV以上のインパルス電圧などの過渡的

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Transcription of 変電機器の短絡試験技術 - meidensha.co.jp

1 Hitoshi Saito Yoshihiko Matsui Akihiko Nakayama Tetsushi Takahashi ISO/IEC17025 .. 1963 .. 1000 MVA 14kV 50Hz . 5 MVA .. 1 .. 2014 5 . ISO/IEC 17025 . JAB .. 4 . ISO/IEC . 17025 .. 60Hz .. 1 . 2 ISO/IEC 17025 . kA . kA .. JSTC Japan 18 357 2017 1 .. EO/OE k 2 EO/OE k 2 A/D O/E . E/O . a .. 1 .. IEC 62271 100 5 .. 3 . A/D O/E . E/O .. b .. 1 .. 5000 10,000 .. Short Circuit Testing Committee .. kV 84kV .. 357 2017 19. C2. MCCB MC MB2 LG T3 MB1. DS ACB. R1 MB2 T4. Rf IVR1 T1 T2 IVR2. R2 R3. T0 MS2. C3 C1. CT1. VT VD1. Sh1 L. MCCB MC VD2 LA1 LA2 LA3 CT2 MB1.. 2 . DS .. I 257A rms . RV rms I 1340A peak f 206Hz V peak t 339ms . a b . 3 . 206Hz 1340A 257A 84kV . 30 MVA . 2 . PLC Programmable 60Hz 50Hz . Logic Controller JEC 2300 2010 .. 60Hz .. 3 4 a . n .. 4 60Hz .. 20 357 2017 3 .. 50Hz 50Hz t 1ms 2 n.

2 2 60Hz 60Hz . 1 . 1 0. 0 0 5 10 15 20 0 5 10 15 20. ms ms . a 60Hz b 60Hz . 4 50Hz .. DC . t 1ms . n . 72 3 2 2 . 288 .. 60Hz . s 6 .. 5 .. 60Hz . 60Hz . 90 200 . 270 . 4 b n . t 1ms 18 .. 60Hz .. 5 .. 60Hz .. 6 . 5 .. Internal arc test IEC 62271 . 357 2017 21.. 6 .. Hitoshi Saito .. Yoshihiko Matsui .. Akihiko Nakayama .. Tetsushi Takahashi . B .. 8 2015 . 22 357 2017


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