Nanometrology - nanoparticles.org

1 Eighth Nanoforum Report: Nanometrology _____ July 2006 1 NanometrologyA Nanoforum report, available for download :Witold Lojkowski,Rasit Turan, Ana Proykova, Agnieszka DaniszewskaAuthors and affiliations:Witold Lojkowski,AgnieszkaDaniszewska, Malgorzata Chmielecka, Roman Pielaszek, RobertFedyk, Agnieszka Opali ska:Institute of High Pressure Physics, Polish Academy of Sciences (UNIPRESS), Turan, SedaBilgi, Ayse Seyhan,Rasit Turan,Selcuk YerciDepartment of Physics, Middle East Technical University (METU), Ankara, Matysiak, Tomasz WejrzanowskFaculty of Materials Science, Warsaw University of Technology, T. BaczewskiInstitute of Physics, Polish Academy of Sciences, Warsaw, Proykova, Hristo IlievMonte Carlo Group,Atomic Physics Department, University of Sofia, CzajkaInstitute of Physics, Faculty of Technical Physics, Pozna University of Technology, Institute of Physics,Department of Biophysics and Molecular Physics,University of Silesia, Katowice, Poland, ~physics/pl/Authorship of SectionsAuthorsIntroduction (1)Witold ojkowski, Ana Proykova, Rasit TuranWhat is special about Nanometrology (2)Witold Lojkowski, Agnieszka DaniszewskaEuropean Nanometrology (3)Malgorzata Chmielecka, AgnieszkaDaniszewska, and all Nanoforum PartnersNanometrology techniques (4)

2 Rasit Turan, Seda Bilgi, Ayse Seyhan, SelcukYerci, Ryszard CzajkaCharacterisation of particle size innanopowders and bulk nanocrystallinematerials (5)Roman Pielaszek, Witold ojkowski, HubertMatysiak, Tomasz Wejrzanowski, AgnieszkaOpalinska, Robert Fedyk, Andrzej Burjan, AnaProykova, Hristo IlievNanometrology in the nanometer rangeof thin film systems and surfaces (6)Lech T. Baczewski, Ryszard CzajkaClassification of Nanostructures ofsemiconductor materials (7)Rasit Turan, Seda Bilgi, Ayse Seyhan, SelcukYerciSummaryAna Proykova, Witold ojkowski, Rasit Turan2 AboutNanoforumThis European Union sponsored (FP5) Thematic Network provides a comprehensive source ofinformation on all areas of nanotechnology to the business, scientific and social communities.

3 Themain vehicle for the thematic network is the dedicated Nanoforumencompasses partners from different disciplines, brings together existing national and regionalnetworks, shares best practice on dissemination of national, EU-wide and Venture Capital funding toboost SME creation, provides a means for the EU to interface with networks, stimulatesnanotechnology in underdeveloped countries, stimulates young scientists, publicises good research andforms a network of knowledge and aims to provide a linking framework for all nanotechnology activity within the EuropeanCommunity. It serves as a central location, from which to gain access to and information aboutresearch programmes, technological developments, funding opportunities and future activities innanotechnology within the Nanoforum consortium consists of:The Institute of Nanotechnology (UK) Technologiezentrum (Germany) (France) TechnoValuation (Netherlands) (Turkey) Carlo Group (Bulgaria).

4 8080/InstituteofHigh PressurePhysics,Polish AcademyofSciences"Unipress (Poland) Nanotechnology Trade Alliance (UK) (Finland) (Austria) (Netherlands) information please contact the coordinator, Mark Nanoforum reportsThe Nanoforum consortium has produced a number of reports on nanotechnology in Europe,all ofwhich are available for free download Reports: 1stNanoforum General Report: Nanotechnology Helps Solve the World s EnergyProblems , first edition published in July 2003,updated in December 2003 and April 2004. 2ndNanoforum General Report: Nanotechnology in the Candidate Countries; Who s Whoand Research Priorities , first edition published in July 2003, updated in November edition published September 2005.

5 3rdNanoforum General Report: Nanotechnology and its Implications for the Health ofthe EU Citizen , first edition published in December 2003. 4thNanoforum General Report: Benefits, Risks, Ethical, Legal and Social Aspects ofNanotechnology , first edition published in June 2004, updated October 2005. 5thNanoforum General Report: European Nanotechnology Education Catalogue , firstedition published in March 2005. 6thNanoforum General Report: European Nanotechnology Infrastructure andNetworks , first published in July 2005. 7thNanoforum General Report: European Support for Nanotechnology SMEs , firstpublished in December socio-economic reports: VC Investment opportunities for small innovative companies , April 2003.

6 Socio-economicreport on Nanotechnology and Smart Materials for Medical Devices ,December 2003. SME participation in European Research Programmes , October background studies to policy seminars: Nanotechnology in the Nordic Region , July 2003. Nano-Scotland from a European Perspective , November reports: Nanotechnology in Agriculture and Food , April : Nanotechnology in the EU Bioanalytical and Biodiagnostic Techniques , September2004. Outcome of the Open Consultation on theEuropean Strategy for Nanotechnology ,December 2004. Funding and Support for International Nanotechnology Collaborations , December2005. Nanotechnology and the Environment , report from the International Workshop inBrussels 29 30 March 2006, published May of and abbreviations frequently used in the is special about Nanometrology ?

7 Of and research of the of size distribution in of nanostructures according to and training courses on and Patents on in for normalization companies involved in institutions active in of Nanometrology of selected nanotechnology Photoelectron Spectroscopy (XPS).. of the nanostructures with Nanostructures with Raman and of particle size in nanopowders and bulk nanocrystalline of specific surface area (SSA).. of pycnometric of Particle Size Distribution of particles in potential and hydrodynamic diffraction equation and analysis of width of XRD or Particle Size of strained and shape of very small nanocrystallites, particles, of surfaces of particles to the diffraction of the crystallite shape on XRD of the structure and sizes of carbon orGrain Size Distribution based on fine analysis of XRD line profiles (XDPFS).

8 Procedure of the XRD measurements of PSD or GSD and average grain & GSD measured by means of fine analysis of XRD peaks as fingerprint ofnanopowders and image analysis of nanoparticles and between image analysis of nanostructures compared to conventional of SEM images of nanoparticles, on the example ofiron oxides produced via ahydrothermal of grain size analysis of of description of the structure of bulk description of the structure of the nanomaterials obtained via SeverePlastic Deformation barriers and in the nanometre range of thin film systems and crystal optical Electron Microscopy (SEM)..101 TEM and Probe Microscopy (SPM) as a measuring tool for tunnelling microscopy (STM): Basic Force Microscope Force Microscope (MFM) and Lift as a scaling tool for of nanostructures of semiconductor summaryThis report aims to provideinformation for a wide audience: academic researchers active innanotechnology; engineers in industry; PhD students; researchers with experience in variousmeasurement techniques who would like to enter the field of nanoscience, nanotechnology, andnanometrology; university and college teachers who would like to widen their knowledge in moderntechniques and methods of material analysis.

9 Fundamental researchers who are interested inimprovement of 'classical' theories that cannot explain the new phenomenaemerging in the field ofnanoscience; investors who would like to benefit from a future technology; SMEs with innovativeprogrammes in their business plans. A wealth of figures, images and graphs give the reader the basisfor understanding the peculiar field of nanosized objects and the materials made of concept of Nanometrology is introduced and defined in the first part of this report. Its importanceis highlighted through an introduction to size property relationships, which is the key aspectofnanometrology. Nanotechnology and nanosciences exploit and study new phenomena that appearwhen some characteristic structure of a material is in the nanometre size range.

10 It is obvious that akey element of Nanometrology is to measure dimensions in the range 1 to about 100 nm (withprecision reaching nm nowadays), and to correlate the measured size with introduction is followed be a review of European institutions and companies active innanometrology, which shows that there are not that many organisations involved with nanometrologyconsidering the importance of the Nanometrology there are two main issues to consider: precise measurement of sizes in thenanometre range, and adapting existing or developing new methods to characterise properties as afunction of size. A direct consequence of this is obviously developing methods to characterise sizesbased on evaluation of properties, and to compare sizes measured using various methods.