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1 page 1 , T otal 25 Pages Page 2 , Total 25 Pages ADH Technology Co. Ltd. OLED Module AOC001602 AYPP5N00001 WEB: E-mail: Page 3 , Total 25 Pages Contents No. Item page 1 . Revision History 4 2. General Specification 4 3. Module Coding System 5 4. Interface Pin Function 6 5. Outline Dimension 7 6. Absolute Maximum Ratings 9 7. Electrical Characteristics 9 8. Optical Characteristics 10 9. OLED Lifetime 10 10. Reliability 11 11.

2 Inspection specification 13 12. Precautions in use of Modules 20 Page 4 , Total 25 Pages 1. Revision History DATE VERSION REVIS ED PAGE NO. Note 2010/8/13 2011/7/1 2012/08/28 1 Firs t iss ue 2 Change vers ion 3 7 Correct count draw ing. 9 Mod if y CIE 17 Mod if y picture 2. General Specification The Features is des cribed as follow: Module dim ens ion: x x (m ax.) m m 3 View area: x m m 2 Acti ve area: x m m 2 Num ber of dots : 16 Character x 2 Line Pixel s ize: x m m 2 Pixel pitch: m m2 Character s ize: x m m2 Character pitch: x m m 2 Duty: 1/16 Em itting Color: Yellow Page 5 , Total 25 Pages 3.

3 Module Coding System 1 2 3 4 5 6 7 8 9 10 11 12 13 A O C 001602 A Y P P 5 N 0 0 001 Item Description 1 A ADH Technology Co. Ltd. 2 O OLED 3 Dis play Type: C Character Type, G Graphic Type 4 Num ber of dots 16 Characters, 2 Lines. 5 Serials code 6 Em itting Color A Am ber R RED B Blue Y Yellow G Green W White 7 Polarizer P With Polarizer; N: Without Polarizer 8 Dis play Mode P Passive Matrix ; A: Acti ve Matri x 9 Driver Voltage 3: V; 5: 10 Touch Panel N Without touch panel; T: With touch panel 11 Species 0:Normal, 1:Sunlight readable, 2:Transparent, 3:Flexible, 4:Lighting 12 Grade code 13 Serial No.

4 001: Sales code Page 6 , Total 25 Pages 4. Interface Pin Function Pin No. Symbol Level Description 1 VSS 0V Ground 2 VDD Supply Voltage for logic 3 NC 4 RS H/L H: DATA, L: Ins truction code 5 R/W H/L H: Read(MPU Module) L: Write(MPU Module) 6 E H,H L Chip enable s ignal 7 DB0 H/L Data bit 0 8 DB1 H/L Data bit 1 9 DB2 H/L Data bit 2 10 DB3 H/L Data bit 3 11 DB4 H/L Data bit 4 12 DB5 H/L Data bit 5 13 DB6 H/L Data bit 6 14 DB7 H/L Data bit 7 15 NC 16 NC Page 7 , Total 25 Pages 2 (AA) (VA) 5.

5 Outline Dimension (VA) (AA) 1 Vss 2 Vdd 3 NC *15= 16- Max 4 RS 5 R/W 6 E 1 16 7 DB0 8 DB1 9 DB2 10 DB3 2. 5 4- PTH 4- PAD 11 DB4 12 DB5 13 DB6 14 DB7 15 NC 16 NC 2. 95 The non-specified tolerance of dimension is mm . DOT SI ZES SCALE 5/1 Page 8 , Total 25 Pages Page 9 , Total 25 Pages 6. Absolute Maximum Ratings Item Symbol Min Max Unit Notes Operating Tem perature TOP -40 +80 C Storage Tem perature TST -40 +80 C Input Voltage VI VDD V Supply Voltage For Logic VDD-VSS V 7.

6 Electrical Characteristics Item Symbol Condition Min Typ Max Unit Supply Voltage For Logic VDD-VSS V Input High Volt. VIH VDD VDD V Input Low Volt. VIL GND V Output High Volt. VOH IOH= A VDD VDD V Output Low Volt. VOL IOL= A GND VDD V Supply Current IDD VDD=5V 30 mA CIEx( Yellow) x,y(CIE1931) CIEy( Yellow) x,y(CIE1931) Page 10 , Total 25 Pages 8. Optical Characteristics Item Symbol Condition Min Typ Max Unit (V) 160 deg View Angle (H) 160 deg Contras t Ratio CR Dark 2000:1 T ris e 10 s Res pons e Time T fall 10 s Supply Voltage For Logic 5V 50% Check Board Brightness With polarizer 150m W(5V*30m A) 125 nits Note1 Supply Voltage For Logic 3V 50% Check Board Brightness With polarizer 80 nits Notes : random texts pattern is running , averagely , at any ins tance , about 1/2 of pixels will be on.

7 2. You can to us e the display off m ode to m ake long life. 9. OLED Lifetime ITE M Conditions Typ Rem ark Operating Life Tim e Notes : Ta= 25 C /Initial 50% checkboard brightness 125nits 100,000 Hrs Note 1. Sim ulation pattern for operation tes t: interchanging with 50% checkboard. The brightness decay does not exceed 50% 2. You can us e the dis play off m ode to m ake long life. 3. The average operating lifetime at room temperature is es tim ated by the accelerated operation at high tem perature conditions . Page 11 , Total 25 Pages 10.

8 Reliability Content of Reliabilit y Test Env ironmental Test Test Item Content of Test Test Condition Applicable Standard Hi gh Temperature storage Hi gh Temperature Operation Low Temperature Operation Hi gh Temperature/ Humi di ty Storage Endurance test appl yi ng the high storage temperature for a long ti me. Endurance test appl yi ng the electri c stre ss (Vol tage & Current) and the thermal stress to the el ement for a long time. Endurance test appl yi ng the electri c stre ss under l ow temperature for a l ong time. Endurance test appl yi ng the high temperature and high humi di ty storage for a l ong ti me.

9 Endurance test appl yi ng the l ow and high temperature cycle. 80 C 240hrs 80 C 240hrs -40 C 240hrs 60 C,90%RH 240hrs Temperature Cycl e -40 C 25 C 80 C -40 C/80 C 100 cycles Mechani cal Test 30min 5mi n 30min 1 cycle 10~22Hz Vibrati on test Endurance test appl yi ng the vi brati on during transportati on and usi ng. Constructi onal and mechani cal 22~500Hz Total 50G Half si gn Shock test Atmospheri c pressure test Others endurance test appl yi ng the shock during transportati on. Endurance test appl yi ng the atmospheri c pressure during transportation by ai r.

10 Wave 11 msedc 3 ti mes of each di rection 115mbar 40hrs Stati c electri ci ty test Endurance test appl yi ng the electri c stre ss to the termi nal . VS=800V,RS= CS=100pF 1 ti me **Supply voltage for logic s ys tem =5V. Supply voltage for LCD s ys tem =Operating voltage at 25 C Page 12 , Total 25 Pages Test and measurement conditions 1. All m eas urements s hall not be s tarted until the s pecim ens attain to tem perature s tability. After the com pletion of the des cribed reliability tes t, the s am ples were left at room temperature for 2 hrs prior to conducting the failure tes t at 23 5 C; 55 15% RH.