AUTOMOTIVE ZERO DEFECTS FRAMEWORK

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AEC - Q004 - Rev- February 26, 2020 AUTOMOTIVE zero DEFECTS FRAMEWORK Component Technical CommitteeAutomotive Electronics CouncilAEC - Q004 - Rev- February 26, 2020 Component Technical CommitteeAutomotive Electronics Council Page intentionally left blank AEC - Q004 - Rev- February 26, 2020 Component Technical CommitteeAutomotive Electronics CouncilTABLE OF CONTENTS 1. SCOPE ........................................ ........................................ ........................................ .......................... 1 Purpose ........................................ ........................................ ........................................ ................. 1 Reference Documents ........................................ ........................................ .................................... 2 Definitions and Acronyms.

AEC-Q102 Failure Mechanism Based Stress Test Qualification for Discrete Optoelectronic Semiconductors in Automotive Applications 6.1, 6.2 AEC-Q103 Failure Mechanism Based Stress Test Qualification for Sensors in Automotive Applications 6.1, 6.2 AEC-Q104 Failure Mechanism Based Stress Test Qualification for Multichip Modules (MCM) In Automotive ...

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