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Search results with tag "Accelerated stress"
Power Semiconductor Reliability Handbook
www.aosmd.comUsing higher-than-normal stress, failure can be induced earlier than usual. Once the lifetime under accelerated stress is obtained, the known accelerated model can be used to predict the product lifetime under normal application stress. But care must be employed to ensure the stress level is reasonable. Over-stress should not occur.
Title HAST (Highly Accelerated Stress Test)
www.test-navi.comThe highly accelerated temperature and humidity stress test (HAST) is a highly accelerated method of electronic component reliability testing using temperature and humidity as the environmental parameters. HAST is also known as the pressure cooker test (PCT) or