Power Semiconductor Reliability Handbook

2010 Alpha and Omega Semiconductor Rev. 5/20/10 Power Semiconductor Reliability Handbook Alpha and Omega Semiconductor 475 Oakmead Pkwy Sunnyvale, CA 94085 Power Semiconductor Reliability Handbook 2010 Alpha and Omega Semiconductor Rev. 5/20/10 2 Table of Contents 1 The AOS Reliability Design-in of Technology Development ..3 Qualification and Product Development ..3 Mass Customer Feedback and Failure Analysis ..4 Continuous Improvement ..4 2 Fundamentals of Reliability ..5 Definition of Bathtub Curve ..5 Infant-Mortality Random-Failure Region ..6 Wear-Out Region ..6 3 Reliability Test Methods ..7 accelerated Life Temperature Acceleration ..8 Activation Voltage Acceleration ..9 Temperature-Cycle Humidity Acceleration.

Using higher-than-normal stress, failure can be induced earlier than usual. Once the lifetime under accelerated stress is obtained, the known accelerated model can be used to predict the product lifetime under normal application stress. But care must be employed to ensure the stress level is reasonable. Over-stress should not occur.

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  Stress, Accelerated, Accelerated stress

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