Yield and Yield Management - Smithsonian Institution

Figure 3-2. Typical 1996 Silicon Wafer IC Probe Yield Losses Figure 3-3. Sources of Wafer-Level Contamination Source: CleanRooms 19973A People Cleanroom Processes Equipment 0 10 20 30 40 50 60 70 80 90 100 1985 1990 1995 2000 Percent Year

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