Transcription of Application Note 24 A Simplified Test Set for Op Amp ...
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LM709. Application Note 24 A Simplified Test Set for Op Amp characterization Literature Number: SNOA637. A Simplified Test Set for Op Amp characterization AN-24. National Semiconductor A Simplified Test Set for Application Note 24. M. Yamatake Op Amp characterization April 1986. INTRODUCTION POWER SUPPLY. The test set described in this paper allows complete quanti- Basic waveforms and dc operating voltages for the test set tative characterization of all dc operational amplifier param- are derived from a power supply section comprising a posi- eters quickly and with a minimum of additional equipment. tive and a negative rectifier and filter, a test set voltage regu- The method used is accurate and is equally suitable for labo- lator, a test circuit voltage regulator, and a function genera- ratory or production test for quantitative readout or for limit tor.
A Simplified Test Set for Op Amp Characterization INTRODUCTION The test set described in this paper allows complete quanti-tative characterization of all dc operational amplifier param-
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