Transcription of IEEE TRANSACTIONS ON ELECTRONICS PACKAGING …
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IEEE TRANSACTIONS ON ELECTRONICS PACKAGING …
IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, VOL. 32, NO. 1, JANUARY 200941 Tin whisker electrical short CircuitCharacteristics part IIKarim J. Courey, Shihab S. Asfour, Arzu Onar, Jon A. Bayliss, Lawrence L. Ludwig, and Maria C. WrightAbstract Existing risk simulations make the assumption thatwhen a free tin whisker has bridged two adjacent exposed electricalconductors, the result is an electrical short circuit . This conserva-tive assumption is made because shorting is a random event thathas an unknown probability associated with it. Note however thatdue to contact resistance, electrical shorts may not occur at lowervoltage levels. In our first paper, we developed an empirical prob-ability model for tin whisker shorting. In this paper, we develop amore comprehensive empirical model using a refined experimentwith a larger sample size, in which we studied the effect of varyingvoltage on the breakdown of the contact resistance which leads to ashort circuit .
COUREY et al.: TIN WHISKER ELECTRICAL SHORT CIRCUIT CHARACTERISTICS—PART II 43 Fig. 4. Schematic diagram for the tin whisker test station instrumentation. Re-produced from [4]. Fig. 5. Tin whisker test station probing area close up.
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