Transcription of Ion Beam Sputtering: Practical Applications to …
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Ion Beam Sputtering: Practical Applications to …
1 EM Sample Preparation Applications Laboratory Report 91 Introduction Electron microscope specimens, both scanning (SEM) and transmission (TEM), often require a conductive coating applied to the sample prior to analysis. Conductive coatings serve several purposes in electron microscopy Applications and are generally designed to minimize charging of the sample, conduct away heat from the sample during imaging, and to increase the secondary electron yield of the sample (1).
1 EM Sample Preparation Applications Laboratory Report 91 Introduction Electron microscope specimens, both scanning (SEM) and transmission (TEM), often require a …
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