Transcription of Microelectronics Reliability: Physics-of-Failure Based ...
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National Aeronautics and Space Administration Microelectronics Reliability: Physics-of-Failure Based Modeling and lifetime Evaluation Mark White Jet Propulsion Laboratory Pasadena, California Joseph B. Bernstein University of Maryland College Park, Maryland Jet Propulsion Laboratory California Institute of Technology Pasadena, California JPL Publication 08-5 2/08. National Aeronautics and Space Administration Microelectronics Reliability: Physics-of-Failure Based Modeling and lifetime Evaluation NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance Mark White Jet Propulsion Laboratory Pasadena, California Joseph B. Bernstein University of Maryland College Park, Maryland NASA WBS: JPL Project Number: 102197. Task Number: Jet Propulsion Laboratory 4800 Oak Grove Drive Pasadena, CA 91109.
lifetime of most commercial parts is the ultimate casualty. Most large systems are built with the assumption that electronic components will last for decades without failure. However, counter to this assumption, device reliability physics is becoming so well understood that manufacturing
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