Optocoupler, Phototransistor Output, High Reliability ...

Semiconductors Rev. , 31-Aug-151 Document Number: 83740 For technical questions, contact: DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENTARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT , Phototransistor Output, High Reliability ,5300 VRMS, 110 C RatedDESCRIPTIONThe 110 C rated SFH617A (DIP) feature a high current transfer ratio, low coupling capacitance and high isolation voltage. These couplers have a GaAs infrared diode emitter, which is optically coupled to a silicon planar Phototransistor detector, and is incorporated in a plastic DIP-4 coupling devices are designed for signal transmission between two electrically separated couplers are end-stackable with mm and clearance distances of > mm are achieved with option Operating temperature from -55 C to +110 C Good CTR linearity depending on forward current Isolation test voltage, 5300 VRMS High collector emitter voltage, VCEO = 70 V Low saturation voltage Fast switching times Low CTR degradation Temperature stable Low coupling capacitance End stackable, " ( mm) spacing High common mode interference immunity Material categorization: for definitions of compliance please see AC adapter SMPS PLC Factory automation Game consolesAGENCY

Refer to wave profile for soldering conditi ons for through hole devices (DIP). Note • Minimum and maximum values are testing requirements. Typical values are characteristics of the device and are the result of engineering evaluation. Typical values are for information only and are not part of the testing requirements.

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