Transcription of Power Semiconductor Reliability Handbook
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2010 Alpha and Omega Semiconductor Rev. 5/20/10 Power Semiconductor Reliability Handbook Alpha and Omega Semiconductor 475 Oakmead Pkwy Sunnyvale, CA 94085 Power Semiconductor Reliability Handbook 2010 Alpha and Omega Semiconductor Rev. 5/20/10 2 Table of Contents 1 The AOS Reliability Design-in of Technology Development ..3 Qualification and Product Development ..3 Mass Customer Feedback and Failure analysis ..4 Continuous Improvement ..4 2 Fundamentals of Reliability ..5 Definition of Bathtub Curve ..5 Infant-Mortality Random-Failure Region ..6 Wear-Out Region ..6 3 Reliability Test Methods ..7 Accelerated Life Temperature Acceleration ..8 Activation Voltage Acceleration.
Power Semiconductor Reliability Handbook © 2010 Alpha and Omega Semiconductor www.aosmd.com Rev. 1.0 • 5/20/10 4 1.6 Customer Feedback and Failure Analysis
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RELIABILITY ANALYSIS METHODS FOR, RELIABILITY ANALYSIS METHODS FOR CALIBRATION, Analysis, Traditions and Alcohol Use: A Mixed-Methods, Traditions and Alcohol Use: A Mixed-Methods Analysis, Methods analysis, Human reliability, Methods, Content Analysis, DOT&E Reliability Course, Reliability, ELECTRONICS INDUSTRIES Performance Test, Failure Analysis Methods, Research Methods Knowledge Base, Quality and Reliability Manual