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RFIC Test System - National Instruments

RFIC Test SystemTest Solution for power Amplifier and Front End Module Ch aracterizatio nDPD reference Solution Measure AM-AM and AM-PM using modulated waveforms Implement both lookup table (LUT) and memory polynomial model (MPM) DPD algorithmsCharacterization & Manufacturing Test Solutions FPGA-based power level servo 5x to 10x improvements in measurement speed versus traditional instrumentsSystem Features Support for , UMTS, LTE, and LTE-Advanced technologies Getting started LV, C and .NET example programs for DPD, power Servo and Envelope Tracking Measure harmonics up to GHzEnv elo pe Tra cking reference So lutio n Industry leading baseband-to-RF synchronization Cu sto mizable Vccwaveform shaping Advanced digital synchronization with DUTTestStandExample SequencesTran s i t i on t est plan s from in it ial d esign to automated characterization and production test using Tes tSt an dexample Test Soft Front PanelInteractively characterize ET and DPD PA s u s i n g measu rement s s uch as EVM, ACLR, and InstrumentsPXI mo

RFIC Test System Test Solution for Power Amplifier and Front End Module Characterization DPD Reference Solution • Measure AM-AM and AM-PM using

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