RFIC Test System - National Instruments

1 RFIC Test SystemTest Solution for power Amplifier and Front End Module Ch aracterizatio nDPD reference Solution Measure AM-AM and AM-PM using modulated waveforms Implement both lookup table (LUT) and memory polynomial model (MPM) DPD algorithmsCharacterization & Manufacturing Test Solutions FPGA-based power level servo 5x to 10x improvements in measurement speed versus traditional instrumentsSystem Features Support for , UMTS, LTE, and LTE-Advanced technologies Getting started LV, C and .NET example programs for DPD, power Servo and Envelope Tracking Measure harmonics up to GHzEnv elo pe Tra cking reference So lutio n Industry leading baseband-to-RF synchronization Cu sto mizable Vccwaveform shaping Advanced digital synchronization with DUTTestStandExample SequencesTran s i t i on t est plan s from in it ial d esign to automated characterization and production test using Tes tSt an dexample Test Soft Front PanelInteractively characterize ET and DPD PA s u s i n g measu rement s s uch as EVM, ACLR, and InstrumentsPXI modular Instruments including RF signal generators, RF signal analyzers, high speed digital I/O, source measure units (SMUs)

2 , switches, high-speed digitizers, and arbitrary wav efo rm g en erat ors (AWGs ).Application SoftwareNI i n s t ru men t s oft fron t p an el and reference example software provides an easy-to-use interface to modular Instruments and is powered by LabVIEWE mbedded PCAs an emb ed ded PC, a PXI co ntro ller i s t he heart of the PXI System and contains a high-performance multicore processor, deep memory, and multiple hard drive Test Sy stemThe demands of emerging wireless standards such as LTE Advanced and in conjunction with RF power amplifier (PA) technologies such as envelope tracking (ET) and digital pre-distortion (DPD) are creating new test challenges for today s engineers. NI PXI offers complete solutions for PA testing from initial product design to manufacturing test.

3 Benefits of NI PXI solutions include: Best-in-ClassRFMeasurementPerformance Industry-LeadingMeasurementSpeed ReducedCostofTestCustomizable Example ProgramsCustomize your RFIC test System more quickly by modifying ready-to-run Lab VIEW example ArchitectureNI RFIC Test System includes a combination of software and PXI modular Instruments . The System includes an instrument soft panel along with LabVIEW, C, and .NET example programs. In addition, NI TestStandexample sequences allow you to easily automate PA testingwith test executive software. PXI ControllerArbitrary Waveform GeneratorVector Signal AnalyzerHigh-Speed DigitizerSource Measure UnitHigh Speed Digital I/PPXI SystemNI-RFmxMeasurement Driver SoftwareDPD, Envelope Trackinfor WiFiand Cellular DevicesTestStandSequences forCharacterization & ManufacturingDPD,ET, and power Servo LabVIEW /.

4 NETR eference ExamplesRFIC Test So ft Fro n t PanelRFIC Measu rement Example ProgramsHardwareVector Signal Solution OverviewDigital pre-distortion (DPD) is a popular technique to correct for signal distortion and improve PA metrics such as ACLR and EVM. Testing a PA under DPD conditions involves four key operations: characterizing device behavior, model extraction, model inversion, and application of predistortionto baseband IQ samples. When testing DPD enabled PA s and front end modules, the RFIC Test Soft Front Panel allows you to interactively apply DPD models and observe device behavior. This solution supports three DPD models, the memoryless AM-AM/PM lookup table (LUT), the Memory Polynomial Model (MPM), and the Generalized Memory Polynomial (GMP ).

5 In addition, the included LabVIEW example programs allow you to automate device testing. Because these example programs use the same underlying measurement IP as the soft front panel you can more easily correlate results from the interactive and automated use VisualizationObserve improvements in spectral regrowth and modulation quality in real Linearity MeasurementsObserve AM-AM and AM-PM response of the PA with and without Performance MetricsUse metrics such as ACLR, EVM, power , and RMS memory to characterize PA performance. Harmonics MeasurementsMeasure harmonics up to GHz using the high performance 5668R Vector Signal Solution Hardware ConfigurationFor DPD testing, the RFIC Test System combines multiple Instruments into a single System including the NI vector signal transceiver (VST), precision power supplies, and high speed digital I/O.

6 The NI VST is a key element of the measurement configuration and combines an RF signal generator and RF signal analyzer into one module. Tight synchronization between RF signal generator and acquisition enables you to accurately measure AM-AM/PM using modulated waveforms. NI PXI has the added benefit of accelerating measurement speed through NI-RFmxmeasurement software. This software takes advantage of multicore processors for highly mathematically complex algorithms such as the memory polynomial DPD Solution Features & SpecificationsDPD Models MemorylessAM-AM/PM LUT Memory Polynomial Model Generalized Memory PolynomialMeasurements AM-AM/PM power EVM ACLR SEM RMS Memory (Phase) HarmonicsSupported Signal Types UMTS (WCDMA, HSPA, HSPA+), LTE / LTE-Ad v an ced , GSM / EDGE, TDSCDMA, CDMA2 k and EVDO WLAN 8 0 2.

7 1 1 a/b/ g/h /n/ acIncludedProducts NI PXIe-1085 18-Slot PXI Chassis NI PXIe-8135 Embedded Controller NI PXIe-5646R Vector Signal Transceiver NI PXIe-4139 Source Measure Unit NI PXIe-6556 High Speed Digital I/O NI PXIe-5668R Vector Signal AnalyzerVector Signal TransceiverPXI ChassisMIPI RFFE ControlHigh Speed DigitalI/O & P P MUDig ita lI/OPrecision SourceMeasure UnitDCo u tPAStimulusResponseVector Signal AnalyzerPXI ControllerRFinRFo u Tracking Solution Overview Envelope tracking (ET) is an increasingly popular technique to improve the efficiency of power amplifiers for modern wireless signals with a high peak to average power ratio (PAPR). PA efficiency is highest when a PA nears compression, an ET power Supply (ETPS) is used to dynamically vary the power supply in conjunction with the amplitude of a modulated wireless signal.

8 Envelope tracking keeps a PA near compression as often as possible thus improving overall ET testing, the NI RFIC Test Soft Front Panel transforms multiple Instruments into a single measurement experience. Instruments include the NI Vector Signal Transceiver (VST), arbitrary waveform generator (AWG), and high-speed digitizer. The GUI provides an easy-to-use interface for synchronizing all of these Instruments and also supplies UMTS and LTE waveforms. The System also features LabVIEW, C, and .NET example code that you can customize for automated test AlgorithmsApply DPD algorithms to ET PAs to correct for AM-AM and AM-PM ControlApplies envelope shaping and real-time control of VSG-to-AWG PerformanceObserve AM-AM and AM-PM behavior of PA under envelope tracking Performance MetricsUse metrics such as ACLR, EVM, power , and RMS memory to characterize PA performance.

9 Tracking Solution Hardware ConfigurationA critical challenge for ET PA Testing is synchronization and stable alignment of RF and Vccsignals supplied by a vector signal generator (VSG) and arbitrary waveform generator (AWG). The RFIC Test System is based on NI PXI instrumentation and features shared trigger and timing bus resources. This implementation produces synchronization jitter between RF and Vccsignals that is less than 20 ps. In addition, by routing timing signals on the PXI backplane, these results are stable and repeatable. The software includes the NI Fast ET Align measurement which rapidly estimates RF and Vccalignment. Finally, the envelope tracking software can simultaneously apply DPD to the stimulus Tracking Solution Features & SpecificationsVector Signal TransceiverHigh Speed DigitizerMeasure PA BehaviorHigh Speed Digital I/O & P P MUArbitrary Waveform GeneratorPrecision power SupplyPXI ControllerPower ModulatorRFo u tPXI ChassisDig ita lI/ODCo u tVccOu tCh1Ch0 PAMIPI RFFE ControlSplitterShaped EnvelopeSynchronization AWG-to-VSG Jitter: < 20 ps AWG-to-VSG skew resolution.

10 1 nsSupportedSignalTypes UMTS (WCDMA, HSPA, HSPA+), LTE / LTE-Advanced, GSM/EDGE, TDSCDMA, CDMA2k and EVDO WLAN NI LabVIEW System Design Software NI PXIe-1085 18-Slot Chassis NI PXIe-8135 Embedded Controller NI PXIe-5646R Vector Signal Transceiver NI PXIe-5451 Arbitrary Waveform Generator NI PXIe-4139 Precision Source Measure Unit NI PXIe-5162 High Speed Digitizer NI PXIe-6556 High Speed Digital I/OVector Signal AnalyzerRFinPower Amplifier Characterization Solution OverviewThe emergence of new wireless technologies and multi-mode power amplifiers are increasing the demands on automated power amplifier testing both in characterization and in high-volume manufacturing test.