Transcription of Simultaneous atomic-resolution electron ptychography …
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Simultaneous atomic-resolution electron ptychography …
ARTICLER eceived 22 Dec 2015|Accepted 8 Jul 2016|Published 26 Aug 2016 Simultaneous atomic - resolution electronptychography andZ-contrast imaging of lightand heavy elements in complex nanostructuresH. Yang1, Rutte2, L. Jones1, M. Simson3, R. Sagawa4, H. Ryll5, M. Huth3, Pennycook6, Green2,H. Soltau3, Y. Kondo4, Davis2& Nellist1 The aberration-corrected scanning transmission electron microscope (STEM) has emergedas a key tool for atomic resolution characterization of materials, allowing the use of imagingmodes such asZ-contrast and spectroscopic mapping. The STEM has not been regarded asoptimal for the phase-contrast imaging necessary for efficient imaging of light , recent developments in fast electron detectors and data processing capability is shownto enable electron ptychography , to extend the capability of the STEM by allowingquantitative phase images to be formed simultaneously with incoherent signals.
A first proof-of-principle attempt to form simultaneous ADF and phase-contrast images21 was also limited in field of view by the camera speed. Differential phase contrast (DPC) images
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