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STRESS TEST QUALIFICATION FOR PASSIVE COMPONENTS

AEC-Q200 REV D. June 1, 2010. STRESS TEST QUALIFICATION . FOR. PASSIVE COMPONENTS . Automotive Electronics Council Component Technical Committee AEC-Q200 REV D. June 1, 2010. Automotive Electronics Council Component Technical Committee Acknowledgement Any Document involving a complex technology brings together experience and skills from many sources. The Automotive Electronics Council would especially like to thank the technical committee members that provided input for this document and recognize the following co-authors: Sustaining Members Robert Hulka, Jr. Delphi (765)451-8079 Bob Knoell Visteon (734)710-7687 Ken Kirby Jr. Visteon (734)710-7689 Ron Haberl Visteon (734)710-7691 Hadi Mehrooz Continental (256)464-1481 Jason Larson Continental Tom Mitchell Autoliv (248)223-8165 Gary Fisher JCI (616)394-6356 Technical Members Steve Maloy TDK (770)487-1460 Patrick Neyman Tyco Andy Mahard Vishay (847)862-0223 Dave Richardson Vishay (770)887-2021 Ted Krueger Vishay +(886) 2-2914-2601 Roger Roberts Vishay Mary Carter-Berrios Kemet (650)361-2256 Daniel Vanderstraet

Table 7E - Acceptance Criteria for Wire Wound Leaded Fixed Resistors 39 Table 7F - Acceptance Criteria for SMD Chip Resistors 40 Table 8 - Table of Methods Referenced Thermistors 41-42 Table 8A - Thermistor Process Change Qualification Guideline for the Selection of Test 43 ... FOR PASSIVE ELECTRICAL DEVICES 1.0 SCOPE 1.1 Description

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