Transcription of Vi-Chip Environmental Qualification Testing …
{{id}} {{{paragraph}}}
Page 1 of 14 VI chip Environmental Qualification Testing standards Revision:0 report Dated: June 11th, 2014 report Prepared By: Noel Joyce Reliability Lab Manager Page 2 of 14 Table of Contents .. 3 Summary .. 3 Test Conditions.. 4 HIGH TEMPERATURE OPERATING BIAS TEST (HTOB) .. 4 Test Criteria .. 4 TEMPERATURE CYCLING (TC) TEST .. 5 Cycling (TC) Test Criteria .. 5 TEMPERATURE HUMIDITY BIAS (THB) .. 6 THB Conditions .. 6 LOW TEMPERATURE STORAGE TEST ( LTS) .. 7 HIGH TEMPERATURE STORAGE TEST ( HTS).
Page 1 of 14 VI Chip Environmental Qualification Testing Standards Revision:0 Report Dated: June 11th, 2014 Report Prepared …
Domain:
Source:
Link to this page:
Please notify us if you found a problem with this document:
{{id}} {{{paragraph}}}
Package Qualification Summary Report, Qualification, Report, Edition Crystalline Silicon Terrestrial Photovoltaic PV, UNITED NATIONS / DOT PERFORMANCE, Alpha & Omega Semiconductor, Summary, REMUNERATION OF ACADEMIC STAFF AT, Summary report, PERSONNEL QUALIFICATION STANDARD, ORTLOFF ENGINEERS, LTD. Summary of SULFUR, ORTLOFF ENGINEERS, LTD. Summary of SULFUR RECOVERY PROJECTS, 92) PERSONNEL, 92) personnel qualification standards pqs, DAMAGE CONTROL DC